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Hafnia OpticalWaveguides SolarCell Ecoli Litho AIN Chloroform fluoroalkane TransitionMetal SelfAssembly Heating INSP C36H74 Laser BTO HexagonalBN MeltingPoint molecular_self_assembly SicMosfet Pattern CeramicCapacitor Bacterium AAO pinpoint mode dichalcogenide Electrode PatternedSapphireSubstrat Microchannel atomic_layer Granada INSPParis MESA structure LateralForceMicroscopy PVAC Steps
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Graphene
Scanning Conditions
- System: XE7
- Scan Mode: Conductive AFM
- Cantilever: NSC36C Cr-Au (k=0.6N/m, f=65kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256