-
Varistor Ananth atomic_layer AAO Conducting Ni81Fe19 Defects ScratchMode Piranha Gallium_Arsenide UnivMaryland PinpointPFM YszSubstrate TemperatureControlledAFM Permalloy KPFM SurfaceChange TipBiasMode Dimethicone TPU Electronics exfoliate OpticalElement ForceVolumeMapping Pipette FrequencyModulation IISCBangalore SRAM C_AFM Alkane Pore BiVO4 3-hexylthiophene DeflectionOptics Change
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Graphene
Scanning Conditions
- System: XE7
- Scan Mode: Conductive AFM
- Cantilever: NSC36C Cr-Au (k=0.6N/m, f=65kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256