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Tungsten_disulfide SKPM Ni-FeAlloy HDD ForceMapping Holes Logo Polytetrafluoroethylene TappingMode conductive piezoelectric force microscopy CeramicCapacitor FrictionalForceMicroscopy tip_bias_mode blended polymers Treatment thermal_property Metal-organicComplex Composition AAO OpticalWaveguides SFAs Pvdf Mfm Sadowski ElectrostaticForceMicroscopy BiasMode HighAcpectRatio block_copolymer PvdfBead Pzt ring shape HighResolution silicon_carbide dielectric_trench
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Polytetrafluoroethylene membrane filter
Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 25μm×25μm
- Scan Rate: 0.1Hz
- Pixel: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 25μm×25μm
- Scan Rate: 0.1Hz
- Pixel: 512×512