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PhaseTransition Zhi hard_disk Crystal NiFe Blend Magnets ForceVolume DeflectionOptics PDMS Cell Electrical&Electronics temperature controller AFM IMT_Bucharest AM_KPFM ConductiveAFM Cobalt gallium_nitride Tin sulfide Vortex BiVO4 Nanopattern lift_mode Implant Sio2 Piranha strontiu_titanate Defect WS2 pinpoint mode Nickel MonoLayer Adhesion DomainSwitching Ananth
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2L-MoS₂ (2/3)
Scanning Conditions
- System : FX40
- Sample bias: 0.5 V
- Scan Mode: C-AFM, LFM
- Scan Rate : 12 Hz
- Scan Size : 1μm×1μm
- Pixel Size : 512×512
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)