-
Electrode Layer Hexylthiophene Grain Dimethicone Reduction Temasek_Lab semifluorinated alkane Magnetic Battery Mapping Pattern SingleLayer BiVO4 MultiferroicMaterials FM_SKPM temperature_control HexacontaneFilm PolyStylene EvatecAG Hysteresys ForceVolume CeramicCapacitor PtfeFilter PVAP3HT TemperatureControl Writing NUS_NNI_Nanocore silicon_oxide CuFoil self_assembly Device Anneal Strontium GlassTemperature
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
GaN on Si epi film
Scanning Conditions
- System : NX20
- Scan Mode: Non-contact
- Scan Rate : All 2 Hz
- Scan Size : 5µm2, 5µm2
- Pixel Size : ALL 512×512
- Cantilever : OMCL-AC160TS (k=26N/m, f=300kHz)