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AM-KPFM ChemicalCompound Polypropylene fe_nd_b 2d_materials BariumTitanate MechanicalProperties ferromagnetic atomic_steps ThermalConductivity PDMS TPU OpticalWaveguides ContactMode Tungsten SKPM Non-ContactMode Phthalocyanine AEAPDES gallium_nitride ConductiveAFM Tin disulfide dielectric_trench Sidewall HighAspect dielectric trench IVSpectroscopy Mapping Step Oxide NTU Hexatriacontane NtuEee layers self_assembly
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GaN epi wafer
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 0.7 Hz
- Scan Size : 5μm×5μm
- Pixel Size : 512×512
- Cantilever : PPP-NCHR (k=42N/m, f=330kHz)