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Plug CP-AFM PANI exfoliate DIWafer Thermoplastic_polyurethane MeltingPoint Bacterium PolymerPatterns CuSubstrate Foil TransitionMetal ForceMapping Pore SicMosfet Composition STO semifluorinated_alkanes BTO Fiber SiliconeOxide Titanate Chrome DNAProtein KelvinProbeForceMicroscopy IcelandSpar Steps TemperatureControllerStage Phenanthrene C_AFM Moire ForceVolumeMapping PhthalocyaninePraseodymium China dichalcogenide
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BTO
Scanning Conditions
- System: XE7
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac