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Vortex kelvin probe force microscopy 2-vinylpyridine Logo Grain epitaxy LithiumNiobate pinpoint mode PS_LDPE Chrome Typhimurium NUS Magnetostrictive PDMS NtuEee TungstenThinFilmDeposition AnodizedAluminumOxide Gong Conductive AFM pulsed_laser_deposition SicMosfet Wang SrO Iron Pore Electronics SiliconOxide SmalScan Bacterium MagneticArray Electrical&Electronics Chloroform HOPG Vanadate IIT-chennai
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Scanning Conditions
- System: XE7
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac