Adaptable to any project
Electrical and Other Sample Characterization Modes
NX series의 다양한 스캐닝 모드와 모듈 설계는 원자 현미경용 프로젝트를 수행하는데 매우 효과적입니다.
Park NX10 has the most extensive range of SPM modes
Standard Imaging
Chemical Properties
Force Measurement
Electrical Properties
- Conductive AFM
- I-V Spectroscopy
- Scanning Kelvin Probe Microscopy (SKPM/KPM)
- SKPM with High Voltage
- Scanning Capacitance Microscopy (SCM)
- Scanning Spreading-Resistance Microscopy (SSRM)
- Scanning Tunneling Microscopy (STM)
- Time-Resolved Photo Current Mapping (PCM)
Magnetic Properties
Optical Properties
Dielectric/Piezoelectric Properties
- Electrostatic Force Microscopy (EFM)
- Dynamic Contact EFM (EFM-DC)
- Piezoelectric Force Microscopy (PFM)