NANOscientific Magazine, Fall-Winter 2023

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LINK 1: NANOscientific Magazine, Fall-Winter 2023

Characterizing Displacement and Voltage Induced on a Piezo/Photodiode Device by Pulsed Laser Excitation Using Time-Resolved Kelvin Probe Force Microscopy
Intrinsic electrical characterization of twodimensional transition metal dichalcogenides via scanning probe microscopy
NanoScientific Magazine Interview
Advancing Electrical Characterization: Exploring the Capabilities of Scanning Microwave Impedance Microscopy Integrated with Atomic Force Microscopy
Primer: Surface Analysis Techniques Using Atomic Force Microscopy
NanoScientific Magazine Interview
Dynamic self-stabilization in the electronic and nanomechanical properties of an organic polymer semiconductor
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