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Change Tin sulfide Sapphire dielectric_trench Defects Thermal NCM\ Electrical&Electronics Trench FuelCell Piranha amplitude_modulation molecule Polystyrene Inorganic_Compound Pyroelectric block_copolymer BiasMode Lift Silver Ferroelectric 2dMaterials fluorocarbon Vacuum FailureAnalysis LFM Ananth tip_bias_mode layers C36H74 Growth gallium_nitride PyroelectricDetector DeoxyribonucleicAcid pinpoint mode
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Graphene on Boron Nitride
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size: 0.5μm×0.5μm, 0.1μm×0.1μm
- Scan Rate: 10Hz, 20Hz
- Pixel: 512×512, 256×256
- Scan Mode: Non-contact
- Cantilever: AC55TS (k=85N/m, f=1600kHz)
- Scan Size: 0.5μm×0.5μm, 0.1μm×0.1μm
- Scan Rate: 10Hz, 20Hz
- Pixel: 512×512, 256×256