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Polydimethylsiloxane Fe_film AdhesionEnergy Morphology MfmPhase AM_SKPM Polyvinylidene Growing ItoGlass PtfeFilter hard_disk PolyvinylideneFluoride Defect NanoLithography Varistor piezoelectric force microscopy SrTiO3 Topography NUSNNI MagneticForce Hafnium_dioxide Bacterium InLiquid SelfAssembly mono_layer mfm_amplitude Metal-organicComplex Tin disulfide Celebration SingleCrystal contact Pinpoint Molybdenum_disulfide EPFL exfoliate
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ITO glass
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 20μm×20μm, 1μm×1μm
- Scan Rate: 0.2Hz, 0.5Hz
- Pixel: 512×512, 512×512
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 20μm×20μm, 1μm×1μm
- Scan Rate: 0.2Hz, 0.5Hz
- Pixel: 512×512, 512×512