-
Sphere semifluorinated alkane Wang SFAs MoirePattern Polytetrafluoroethylene Ito ElectroChemical Laser Chemical_Vapor_Deposition UnivOfMaryland MechanicalProperties ContactModeDot CompactDisk Ecoli Collagen PVAC Insulator plastics MultiferroicMaterials CarbonNanotube Sic Optoelectonics STO NanoLithography HanyangUniv LateralForceMicroscopy Polystyrene Film Dopped ContactMode MagneticArray PvdfBead temperature controller AFM epitaxy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
BiVO4 on treated YSZ substrate
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.36Hz
- Pixel: 256×256