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AEAPDES ForceVolumeImage Transparent NeodymiumMagnets polyvinyl acetate Zhi Insulator Molybdenum SmalScan Silicon FloppyDisk ElectroDeposition Organic C_AFM Vacuum Array ImideMonomer Beads Fluoride PetruPoni_Institute Pvdf non_contact IISCBangalore ConductiveAFM TungstenThinFilmDeposition Pinpoint Foil Nanofiber Holes PolyimideFilm SelfAssembly PVA OpticalWaveguides MolybdenumDisulfide SKKU
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Graphene on hBN
Scanning Conditions
- System : FX40
- Sample bias: 1 V
- Scan Mode: C-AFM
- Scan Rate : 25 Hz for 25 nm2, 10 Hz for 50 nm2
- Scan Size : 25nm2×25nm2
- Pixel Size : 128×128 for 25 nm2, 256×256 for nm2
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)