-
ConductiveAFM Electronics neodymium_magnets Anneal Scratch Iron Grain Korea CuSubstrate HighResolution Resistance PDMS Piezoelectric thermal_property StrontiumTitanate MetalCompound Gold Electrode BreastCancerCell light_emitting organic_polymer medical AlkaneFilm Crystal AnodizedAluminumOxide HafniumDioxide Spincast semifluorinated alkane Phosphide Croatia Dimethicone Monisha polymeric_arrays YttriaStabilizedZirconia PiezoelectricForceMicroscopy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
2L-MoS₂ (2/3)
Scanning Conditions
- System : FX40
- Sample bias: 0.5 V
- Scan Mode: C-AFM, LFM
- Scan Rate : 12 Hz
- Scan Size : 1μm×1μm
- Pixel Size : 512×512
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)