-
GlassTemperature KevlarFiber Graphite EPFL ContactModeDot Wonseok Ucl F14H20 TipBiasMode Fluoride thermal_conductivity Hydroxyapatite Polyaniline block_copolymer Styrene CancerCell Dopped PolyvinylideneFluoride Zagreb PolymerBlend InLiquid Phthalocyanine LateralPFM Growing ForceVolume Lateral_Force_Microscopy PFM Sadowski Ceramic HexagonalBN silicon_oxide SiliconeOxide multi_layer piezoelectric force microscopy MoS2
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
2L-MoS₂ (2/3)
Scanning Conditions
- System : FX40
- Sample bias: 0.5 V
- Scan Mode: C-AFM, LFM
- Scan Rate : 12 Hz
- Scan Size : 1μm×1μm
- Pixel Size : 512×512
- Cantilever : ElectricMulti75-G (k=3N/m, f=75kHz)