-
Tungsten Insulator KelvinProbeForceMicroscopy Filter LogAmplifier Neodymium Sapphire AdhesionEnergy MLCC GranadaUniv Gong Phase gallium_nitride exfoliate Resistance Film SThM neodymium_magnets IMT_Bucharest IcelandSpar Mechanical CrossSection ElectrostaticForceMicroscopy Nanostructure Polyvinylidene PolyvinylideneFluoride Austenite LateralPFM dichalcogenide Indium_tin_oxide pulsed_laser_deposition Deposition BloodCell solar_cell NusEce
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
WLI image of wafer ID mark
Scanning Conditions
- System : NX-Hybrid WLI
- Scan Mode: WLI
- Field of view: 182μm×182μm