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MfmPhase Magnets TipBiasMode TemperatureControl PolymerPatterns Tape MolecularSelfAssembly Polyimide CeNSE_IISc Film flakes HighAcpectRatio fluorocarbon SAM Croatia C60H122 Flake StrontiumTitanate NTU self-assembly ScanningTunnelingMicroscopy Growing Ptfe Vacuum Stiffness nanomechanical Hexacontane Tin sulfide GaAs ForceMapping SiliconeOxide Optoelectronic Styrene SKPM FrictionalForce
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Graphene on SiO2
Scanning Conditions
- System: NX20
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256
- Scan Mode: PinPoint mechanical mode
- Cantilever: NSC36C
- Approach/Retract speed : 2ms/2ms
- Scan Size: 10μm×10μm, 5μm×5μm
- Pixel: 256 × 256