-
PFM IIT-chennai AEAPDES atomic_layer Electrical&Electronics PyroelectricDetector FrictionForce Defects hetero_structure SolarCell AAO Conductance FM_SKPM Molybdenum ThermalConductivity Stiffness Moire bias_mode Celebration Mechanical&nanotechnology piezoelectric force microscopy Platinum MultiferroicMaterials food Chromium DentalProsthesis Chungnam_National_University Ecoli SicMosfet IndiumTinOxide C60H122 Bismuth HfO2 Mapping MagneticForceMicroscopy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Polymer (2/2)
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: NCHR
- Scan Size:1μm×1μm
- Scan Rate: 1Hz
- Pixel: 256 × 256
- Scan Mode: Tapping
- Cantilever: NCHR
- Scan Size:1μm×1μm
- Scan Rate: 1Hz
- Pixel: 256 × 256