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Mechanical&nanotechnology Dr.JurekSadowski FastScan KevlarFiber RedBloodCell Graphite MultiferroicMaterials Conducting Ram Insulator Techcomp LightEmission OrganicSemiconductor Carbon MoS2 Platinum Sidewall Domain flakes Ca10(PO4)6(OH)2 PolymerBlend Chloroform GaP Optical Tape AmplitudeModulation WS2 Polytetrafluoroethylene Crystal Sadowski Copper AdhesionEnergy Copolymer Nanopattern Conductive AFM
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Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 0.250μm×0.250μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 0.250μm×0.250μm
- Scan Rate: 0.5Hz
- Pixel: 512×512