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HOPG CrossSection InsulatorFilm Growth lift_mode EFMAmplitude Ferroelectric Edwin AEAPDES Polyimide Temasek_Lab Ceramics ConductingPolymer self_healing Cobalt-dopedIronOxide hard_disk_media Au111 Singapore self-assembly mono_layer Wildtype Lateral_Force_Microscopy IndiumTinOxide Piezoresponse PolymerBlend ForceVolume Corrosion PvdfFilm Display layers StrontiumTitanate single_layer thermoplastic_elastomers AmplitudeModulation Tin sulfide
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Hard disk media
Scanning Conditions
- System: NX20
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 0.250μm×0.250μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 0.250μm×0.250μm
- Scan Rate: 0.5Hz
- Pixel: 512×512