-
PhaseChange Chemical Vapor Deposition IVSpectroscopy LiquidCrystal HighAcpectRatio PvdfBead Oxidation Chemical_Vapor_Deposition SurfaceOxidation layers solar_cell ElectroDeposition INSP Polytetrafluoroethylene Lateral SiliconeOxide AIN ContactMode Photovoltaics PyroelectricDetector NiFe conductive Yeditepe Holes Ferrite mfm_amplitude align KAIST PetruPoni SrO ThermalConductivity CuSubstrate TriGlycineSulphate MagneticForceMicroscopy MLCC
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Alkane Film (C60H122)
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 1μm×1μm, 0.5μm×0.5μm
- Scan Rate: 0.8Hz, 0.8Hz
- Pixel: 512×512, 512×512
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 1μm×1μm, 0.5μm×0.5μm
- Scan Rate: 0.8Hz, 0.8Hz
- Pixel: 512×512, 512×512