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self-assembly Aggregated_molecules polymeric_arrays Phase NUS WS2 CarbonNanotube ScanningKelvinProbeMicroscopy Wafer Trench Electrical&Electronics ForceDistanceSpectroscopy MagneticForce Annealing F14H20 DomainSwitching CalciumHydroxide hetero_structure StyreneBeads InLiquid DOE Spain EPFL FM_KPFM Neodymium Defect EvatecAG University_of_Regensburg DeflectionOptics Varistor ConductiveAFM Non-ContactMode WWafer Hexylthiophene Bismuth
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BFO (BiFeO3)
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 10μm×10μm, 5μm×5μm
- Scan Rate: 0.8Hz, 0.8Hz
- Pixel: 512×512, 512×512