-
DLaTGS FastScan IndiumTinOxide semifluorinated_alkane LowDensityPolyethylene PinpointNanomechanicalMode PrCurve Lattice LiNbO3 Fluoride CrossSection Sapphire epitaxy HanyangUniv Corrosion VerticalPFM BreastCancerCell WWafer Boundary OrganicSemiconductor PetruPoni_Institute Ferroelectric Pinpoint PFM LifeScience MembraneFilter AdhesionForce C_AFM Graphene PhaseChange Magnetic Force Microscopy InorganicCompound light_emitting Force-distance atomic_layer Ca10(PO4)6(OH)2
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Stitched image of chiplet
Scanning Conditions
- System : NX-Wafer
- Scan Mode: Non-contact
- Scan Rate : 0.5 Hz
- Scan Size : 100μm×100μm for single image (200μm×200μm stitched image)
- Pixel Size : 512×128 for single image
- Cantilever : OMCL-AC240TS (k=2N/m, f=70kHz)