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Lateral_Force_Microscopy Etch NTU CopperFoil PVAP3HT HardDiskMedia Indium_tin_oxide membrane Tape self-assembled_monolayer Wafer Ucl Scanning_Thermal_Microscopy Zhi Metal LateralForce Annealed Patterns Oxide ConductiveAFM KevlarFiber C60H122 Led atomic_layer PhaseImaging PvdfBead MBE ForceMapping TipBiasMode Ca10(PO4)6(OH)2 Alloy Polyethylene HfO2 Indent Conductivity
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MoS2 (2/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au(k=1N/m, f=90kHz)
- Scan Size: 30μm×30μm,10μm×10μm
- Scan Rate: 0.1Hz
- Pixel: 512×1024