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BiasMode cross section TempControl DataStorage Conductive AFM University_of_Regensburg PtfeMembrane CHRYSALIS_INC Thermoplastic_polyurethane Modulus Ni81Fe19 oxide_layer BlockCopolymer SRAM Annealed Friction HexagonalBoronNitride Floppy InsulatorFilm graphene_hybrid Beads Heat Vacuum MetalCompound IIT-chennai Epoxy ForceVolumeMapping VerticalPFM SiliconOxide LDPE DIWafer Nanopattern CVD Solution Scanning_Thermal_Microscopy
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Crystal
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 2μm×2μm
- Scan Rate: 0.7Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 2μm×2μm
- Scan Rate: 0.7Hz
- Pixel: 256 × 256