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Blend tip_bias_mode PolyStylene FloppyDisk Sapphire Polytetrafluoroethylene Ceramic Dopped IIT-chennai PiezoelectricForceMicroscopy BismuthVanadate TempControl Litho pulsed_laser_deposition HBN Jason VortexCore hard_disk FrictionalForce MultiferroicMaterials Optical Ram StyreneBeads Inorganic BaTiO3 Adhesive Pore Mapping Trench Alloy Fendb Ucl Lattice Co/Cr/Pt Hexylthiophene
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V