-
Device Tin disulfide Al2O3 Ferroelectric Oxidation strontiu_titanate TriGlycineSulphate SingleLayer FrictionalForceMicroscopy AM-KPFM NusEce Christmas SoftSample CeNSE_IISc Ito HanyangUniv IRDetector TCS Piezo Spain ForceMapping Graphite KAIST Subhajjit MoS2 GlassTemperature Temperature Hole GaP FloppyDisk InLiquid KPFM SThM Fiber MagneticForceMicroscopy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Lithography on compact disk
Scanning Conditions
- System: NX10
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256