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Flake Force-distance Ecoli PolymerPatterns Perovskite PpLdpe Topography PhaseImaging Implant GranadaUniv BismuthVanadate PolymerBlend Chungnam_National_University LiquidImaging DIWafer Genetic PDMS pulsed_laser_deposition Reduction AlkaneFilm LiIonBattery Bmp ferromagnetic UTEM WPlug NUS_Physics Lift Pzt SolarCell PECurve Tungsten multi_layer Tin disulfide SicMosfet DomainSwitching
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Lithography on compact disk
Scanning Conditions
- System: NX10
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256