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NusEce Litho CrAu Scanning_Thermal_Microscopy Wildtype RedBloodCell ContactModeDots Boundary BFO fe_nd_b INSPParis pinpoint mode ContactMode AM-KPFM PinPointMode Spain IcelandSpar Tapping Defect Friction TungstenThinFilmDeposition SmalScan molecule PVA Moire PANI Non-ContactMode Device Oxidation lithography CuFoil Adhesion HighAspect Celebration AAO
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Kevlar fiber
Scanning Conditions
- System: XE7
- Scan Mode: NCM, F/D mapping
- Cantilever: Diamond probe(k=151N/m, f=50kHz)
- Scan Size:15μm×15μm
- Scan Rate: 0.5Hz
- Pixel: 512×256
- Scan Mode: NCM, F/D mapping
- Cantilever: Diamond probe(k=151N/m, f=50kHz)
- Scan Size:15μm×15μm
- Scan Rate: 0.5Hz
- Pixel: 512×256