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Mosfet SiliconOxide ElectrostaticForceMicroscopy FrictionForce Photovoltaics Conducting Ceramics LateralForce PVAC Sio2 BismuthFerrite Composition multi_layer Ca10(PO4)6(OH)2 Calcium INSP Fe_film LateralPFM HDD Aggregated_molecules Change Monisha ThermalConductivity Steps Leakage FuelCell HardDiskMedia TungstenThinFilmDeposition AtomicSteps Ni81Fe19 ULCA Graphene AAO ForceVolumeMapping AtomicLayer
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Imprint sample
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate:0.25Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR (k=42N/m, f=300kHz)
- Scan Size: 20μm×20μm
- Scan Rate:0.25Hz
- Pixel: 256×256