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ConductiveAFM NUS Edwin AdhesionForce Biofilm DOE Electrode MultiferroicMaterials ForceMapping Reduction kelvin probe force microscopy PatternedSapphireSubstrat Magnetic Force Microscopy Chungnam_National_University PMNPT MLCC Vinylpyridine light_emitting Sic CompactDisk mechanical property Tin sulfide fluoroaalkane StrontiumTitanate Hydroxyapatite PpLdpe Polypropylene Solar Granada YttriaStabilizedZirconia PANI PvdfBead PolyStylene Force-distance LiNbO3
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CrAu surface
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256