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Cross-section DeflectionOptics TiO2 organic_polymer TappingMode Calcite SicMosfet HighAspect ferromagnetic Vac TemperatureControlledAFM INSPParis plastic Mechanical Electrical&Electronics HardDisk Multiferroic_materials BaTiO3 Pinpoint molecular_self_assembly PDMS PinpointNanomechanicalMode atomic_layer Grain PS_LDPE NiFe contact alkanes ShenYang ThermalProperties norganic TipBiasMode ContactModeDots SiliconOxide SSRM
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Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=300kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 256×256