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Alloy HanyangUniv Steps Dopped Magnetic PolymerPatterns Grain FAPbI3 LateralPFM P3HT Chemical_Vapor_Deposition EvatecAG Wafer DeoxyribonucleicAcid Oxide piezoelectric force microscopy Polystyrene PatternedSapphireSubstrat hetero_structure fluoroalkane CarbonNanotube PinPointMode SelfAssembly StainlessSteel PMNPT PinpointPFM OpticalModulator Phthalocyanine Corrosion FAFailureAnlaysis HafniumDioxide LifeScience Au111 ReflexLens ConductiveAFM
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Polymer patterns on Si (2/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.2Hz
- Pixel: 512×256