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LiquidImaging ForceDistanceSpectroscopy Polymer DOE CastIron Polyvinylidene_fluoride Conductive AFM Magnetic Co/Cr/Pt Grain OpticalModulator membrane frequency_modulation non_contact optoelectronics PolymerBlend PtfeFilter FailureAnalysis Polytetrafluoroethylene Reduction Self-assembledMonolayer Stiffness Optoelectronic Perovskite GlassTemperature Composition Chungnam_National_University dielectric trench Silicon Monisha LateralForceMicroscopy semifluorinated_alkane GaN Polyvinylidene Magnetic Force Microscopy
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Crystal
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 2μm×2μm
- Scan Rate: 0.7Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: NCHR
- Scan Size: 2μm×2μm
- Scan Rate: 0.7Hz
- Pixel: 256 × 256