-
plastics semifluorinated_alkane Polyethylene LiIonBattery Nanofiber PinPointMode atomic_layer Gallium PVAP3HT LateralForceMicroscopy PolycrystallineFerroelectricBCZT Fe_film TriGlycineSulphate Boundary LiftHeight Polarization SingleCrystal Display Polyvinylidene_fluoride LiNbO3 DNA dichalcogenide ScanningSpreadingResistanceMicroscopy Sio2 Biology StrontiumTitanate Hole C_AFM Yttria_stabilized_Zirconia Current EFMAmplitude FM_KPFM BismuthFerrite STO Nanostructure
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Anodized Aluminum Oxide (AAO)
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS
- Scan Size: 0.5Hz, 1Hz
- Scan Rate:20μm×20μm, 5μm×5μm
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC160TS
- Scan Size: 0.5Hz, 1Hz
- Scan Rate:20μm×20μm, 5μm×5μm
- Pixel: 256 × 256