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GaP Nanofiber electrospinning TungstenDeposition exfoliate SurfaceOxidation gallium_nitride fluorocarbon hydrocarbon Wafer Ram DOE Vinylpyridine ForceVolumeMapping dichalcogenide PMNPT PUR StrontiuTitanate Hexatriacontane molecules Alloy LFM Tungsten_disulfide SFAs SelfAssembly Formamidinium_lead_iodide membrane Growth ScanningSpreadingResistanceMicroscopy Change StyreneBeads fe_nd_b MonoLayer PS_PVAC SoftSample
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BTO
Scanning Conditions
- System: XE7
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac
- Scan Mode: DC-EFM(Vertical)
- Cantilever: ElectriMulti75G (k=3N/m, f=75kHz)
- Scan Size: 20μm×20μm
- Scan Rate: 0.2Hz
- Pixel: 256×256
- Sample Bias: 0V
- Tip Bias: 1V ac