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HighResolution Copolymer molecular_self_assembly VerticalPFM contact ThinFilm Conductivity Polyethylene Microchannel KevlarFiber Array #EC Ca10(PO4)6(OH)2 gallium_nitride Battery Polyvinylidene_fluoride IMT_Bucharest 2d_materials Hysteresys pinpoint mode Cobalt PolycrystallineFerroelectricBCZT OpticalModulator ForceVolume ForceMapping Composite LiquidCell PtfeMembrane Force-distance Ceramics STO LateralPFM Annealing FAFailureAnlaysis alkanes
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V