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Electical&Electronics Sic STM AM_SKPM Liquid hard_disk Force-distance temperature controller AFM non_contact PDMS ferromagnetic UnivMaryland Implant BFO PetruPoni_Institute optoelectronics Biology block_copolymer P3HT Memory molecule Vac fluoroalkane contact GaAs Phthalocyanine suspended_graphene Laser Ananth Collagen PetruPoni exfoliate Non-ContactMode ForceVolumeImage Optical
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V