-
Friction Mfm DomainSwitching ElectroDeposition Cancer semifluorinated alkane FM-KPFM RedBloodCell Lateral_Force_Microscopy rubber Phase SFAs StrontiuTitanate amplitude_modulation Yttria_stabilized_Zirconia VerticalPFM Vinylpyridine Wildtype Polydimethylsiloxane Monisha LightEmiting polyvinyl acetate Ceramics NCM Optoelectronic blended polymers Morphology Galfenol Annealing EFMAmplitude MLCC Modulus Chemical Vapor Deposition H-BN ForceVolumeImage
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V