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Bio TungstenDeposition Jason MLCC Typhimurium organic_polymer Mfm Writing cooling OrganicCompound ThermalProperties mechanical property Insulator Polarization HfO2 StrontiumTitanate Hafnia HOPG Sic Temasek_Lab self-assembly Inorganic_Compound FastScan Imprint GaP HiVacuum Scratch BoronNitride WWafer semifluorinated alkane Optical Implant RedBloodCell LateralPFM LiftHeight
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V