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OpticalElement PolyStylene LiquidCell HardDisk Conduct BaTiO3 Sapphire PS_PVAC Phthalocyanine CP-AFM Nanotechnology PpLdpe SSRM PolyimideFilm LowDensityPolyethylene KevlarFiber Forevision 2d_materials PMNPT Microchannel PinPointMode BoronNitride LiBattery LeakageCurrent GaN Non-ContactMode PANI FrictionalForce TCS fluoroaalkane Celebration WPlug biocompatible SolarCell Indium_tin_oxide
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SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V