Inviting attendees to visit Park Systems at booth 417.
Come attend the 47th International Symposium for Testing and Failure Analysis, the premier event for the microelectronics failure analysis community.
Stop by Park System’s booth to learn about the Park NX20 300 mm, designed for failure analysis and quality control laboratories is the world’s most accurate large sample AFM, and is rated highly in the semiconductor and hard disk industry for its data accuracy.
Dr. Sung Park, CEO Molecular Vista will also be a speaker at the User Groups meeting focused on “Contactless Probing and Nanoprobing” held on Wednesday (11/3) from 3:05 to 5:20PM.”
- Event Dates: October 31st – November 4th, 2021
- Venue: Phoenix Convention Center
- Booth: #417