Park Systems announces the debut of the Park XE7, an affordable, research-grade Atomic Force Microscope (AFM). This new product, which includes flexible sample handling, enables scientists to enjoy innovative and more powerful AFM technology than competing products.

Santa Clara, California, February 22, 2013

"We continue to lead within the field of AFM imaging and measurements, delivering state-of-the-art technology and accuracy for a diverse array of researchers, companies and individual scientists,” says Dr. Sang-Il Park, Founder and CEO of Park Systems. “The Park XE7 proves this point: that we give users the most relevant and targeted nanoscale results at a reasonable price."

Advantages of the Park XE7 include: a flat and orthogonal XY scan, made possible by Crosstalk Elimination (XE), where the two independent, closed-loop XY and Z flexure scanners interact with each other. Park XE7 also features a True Non-Contact Mode™ for longer tip lifespan, with minimized sample damage or modification. 

"The Park XE7 combines affordability with the next generation AFM technology we offer on behalf of clients worldwide,” says Ryan Yoo, Vice President of Global Sales and Marketing. “In fact, customers can now purchase a whole new system, which has the best option compatibility and upgradeability in the industry."

For more information please contact psi@parkAFM.com or visit www.parkAFM.com.

About Park Systems
Park Systems serves its customers by providing a complete range of AFM solutions, including AFM systems, options and software, along with global service and support. Park Systems is the leading nanotechnology solutions partner for nanoscale measurements and systems for both research and industry. The product line of Park Systems reflects this focused strength, to help customers achieve the metrology performance that meets the needs and requirements of present and future applications. For more information, visit www.parkAFM.com.