News
26, Nov 12'
Press-Release
Park Systems introduces the NX20, a high-end, large sample atomic force microscope (AFM) for failure analysis (FA) and quality assurance (QA) laboratories that will benef...
26
Oct 2012'
Press-Release
Industry leading low-noise Z detector is used for the default AFM topography signal.
Santa Clara, California, October 26, 2012
Park Systems announces True Sample...
1
Oct 2012'
Press-Release
Santa Clara, California, October 1, 2012
Park Systems, the atomic force microscopy leader, and Emphor free zone company (Dubai, UAE), a leading technology integrator and...
16
Aug 2012'
Press-Release
Park Systems today announced that the Korean Ministry of Knowledge and Economy awarded the Park NX10, the world’s most accurate atomic force microscope, as a NanoKorea 20...
20
Apr 2012'
Press-Release
Santa Clara, California, April 20, 2012
Park Systems, Inc. today announced that Keibock Lee has joined the company as its president and general manager of Park America.&...
31, Jan 12'
Press-Release
Dear Park AFM Users, we are pleased to announce Park Rewards for Application Notes program on the use of Atomic Force Microscopy (AFM) in your research or industrial appl...
22
Nov 2011'
Press-Release
Park Systems has introduced the NX10, the world’s most accurate AFM, as the flagship AFM of its new product line. Now available worldwide, the NX10 brings unparalleled im...