Mechanical Properties
Park Systems offers a set of mechanical scanning modes that easily measure the mechanical properties of a sample. Each mode features Park AFM’s trademark accuracy that allows users to collect reliable data.
Force Modulation Microscopy (FMM)
Park AFM’s FMM mode measures mechanical property variations over a sample’s surface. An AC modulation is applied to the cantilever while in contact with the sample surface, allowing you to monitor changes in amplitude and phase and gain insights into qualitative elastic and viscous responses.
Specifications :
Adjustable modulation frequency: 1 kHz - 600 kHzFrequency resolution: 0.02 Hz
Amplitude detection: < 0.1 nm
Phase resolution: 0.005°
Nanoindentation
Park AFM’s Nanoindentation mode uses excessive force on the cantilever to indent the sample and measure its mechanical properties including hardness and elasticity.
Specifications :
Batch measurement on user specified points or gridIndenting travel range: 12 µm
Displacement resolution: 0.1nm
Load Application: Piezoelectric Actuator
Maximum Load: 100 nN ~ 100 µN
Load Resolution: 100 nN
Nanolithography
Park AFM’s Nanolithography mode allows users to manipulate and create patterning on the sample surface through applied force or voltage. Tip position for lithography can be easily controlled by importing customized vector drawings or raster (bitmap) images.
Specifications :
Lithography method: vector and/or raster scanBias range: ±10V
Bias noise: 20 μV
High Voltage Toolkit required for voltages over ±10V