-
CVD Photovoltaics Lift Cross-section AmplitudeModulation NUS_NNI_Nanocore Holes Monisha OpticalElement thermal_property CrossSection Lateral_Force_Microscopy LaAlO3 ScanningKelvinProbeMicroscopy MagneticForceMicroscopy LiquidCrystal organic_polymer hydrocarbon LifeScience FrictionalForce TungstenThinFilmDeposition Microchannel light_emitting pinpoint mode HafniumDioxide Lanthanum_aluminate PvdfFilm Mosfet AtomicLayer 2-vinylpyridine dielectric trench Co/Cr/Pt Vinylpyridine UTEM Piezo
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Block copolymer ΙΙ
Scanning Conditions
- System: NX10
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm, 0.3μm, 0.1μm
- Scan Rate: 1Hz, 1Hz, 2Hz
- Pixel: 512×512, 256×256, 256×256
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm, 0.3μm, 0.1μm
- Scan Rate: 1Hz, 1Hz, 2Hz
- Pixel: 512×512, 256×256, 256×256