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MeltingPoint TiO2 FloppyDisk InorganicCompound SKPM Chemical_Vapor_Deposition Nanostructure DOE mechanical_property TungstenDeposition Aluminium_Oxide Carbon TempControl Calcite kelvin probe force microscopy SolarCell TriGlycineSulphate ConductiveAFM ContactModeDots CaMnO3 Iron Mfm OpticalWaveguide pinpoint mode HiVacuum Mobile HighResolution Solar Foil rubber Etch SurfaceOxidation MembraneFilter Bacterium Growing
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CrAu surface
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: Non-contact
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 2μm×2μm
- Scan Rate: 0.5Hz
- Pixel: 256×256