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Bio BoronNitride polymeric_arrays Annealed AAO OpticalModulator Array PhaseTransition Ferroelectric Sidewall Polyimide neodymium_magnets Cross-section Insulator hard_disk KAIST SingleCrystal Magnetostrictive Layer TempControl FrequencyModulation University_of_Regensburg PolycrystallineFerroelectricBCZT Film semifluorinated_alkanes Sphere Fendb Carbon ForceVolume NiFe Au111 Bismuth Logo Graphite SmalScan
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CNT Film
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V