-
silicon_carbide light_emitting Organic Materials Polyethylene CuFoil LogAmplifier Worcester_Polytechnic_Institute Iron BreastCancerCell ShenYang CVD IMT_Bucharest Friction SKKU LiftHeight 2d_materials Formamidinium_lead_iodide BariumTitanate AM-KPFM Kevlar AdhesionEnergy Memory Self-assembledMonolayer heterojunctions NCM\ Modulus doped OrganicCompound Molybdenum_disulfide Sic Sidewall SiliconOxide Treatment MultiLayerCeramicCapacitor
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
CNT Film
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V
- Scan Mode: CP-AFM
- Cantilever: CDT-Contr (k=0.5N/m, f=20kHz)
- Scan Size: 45μm×45μm
- Scan Rate: 0.5Hz
- Pixel: 512×512
- Sample Bias: +0.3V