-
KelvinProbeForceMicroscopy Ni-FeAlloy Gold hydrocarbon BismuthFerrite Perovskite PhthalocyaninePraseodymium Zhi Defect Blend Al2O3 IISCBangalore LiftMode MonoLayer Lattice SKKU Deposition oxide_layer SoftSample Indium_tin_oxide MagneticPhase phase_change Fet Self-assembledMonolayer Croatia Pore Annealing LiquidCell EvatecAG FFM Imprint PtfeMembrane Sperm DomainSwitching Vortex
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Multi-layer necking device defect
Scanning Conditions
- System : NX-Wafer
- Scan Mode: C-AFM
- Scan Rate : 2Hz
- Scan Size : 2μm×2μm
- Pixel Size : 512×256
- Cantilever : AD-2.8-AS (k=2.8N/m, f=75kHz)