-
Alkane HighAcpectRatio Optoelectronic IMT_Bucharest FuelCell Resistance PANI Ito self_healing NiFe Etch MagneticForceMicroscopy SThM self-assembly Kevlar silicon_oxide ElectroDeposition plastics FAPbI3 Moire Zhi heterojunctions FrictionalForceMicroscopy Sic C_AFM Annealing Collagen Foil Domain Chemical Vapor Deposition BaTiO3 MagneticArray single_layer Magnetic Force Microscopy Laser
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Semiconductor device, W-plug
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: ElectriMulti75-G (k=3N/m, f=75kHz)
- Scan Size: 2μm×1μm
- Scan Rate: 0.3Hz
- Pixel: 512×256
- Sample bias: +1V