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Spincast Sapphire ReflexLens tip_bias_mode CastIron DataStorage C36H74 ForceDistanceSpectroscopy LateralPFM blended polymers Ram Polymer PtfeFilter Cobalt-dopedIronOxide Ca10(PO4)6(OH)2 AEAPDES Polyaniline molecules MultiLayerCeramicCapacitor self-assembly PvdfFilm Reduction norganic suspended_graphene Adhesion NUS_NNI_Nanocore Tape MESA structure rubber Scratch light_emitting Carbon oxide_layer PolycrystallineFerroelectricBCZT exfoliate
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Semiconductor device, W-plug
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: ElectriMulti75-G (k=3N/m, f=75kHz)
- Scan Size: 2μm×1μm
- Scan Rate: 0.3Hz
- Pixel: 512×256
- Sample bias: +1V