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ScanningIon-ConductanceMicroscopy mechanical property PinpointNanomechanicalMode GranadaUniv Phase ContactModeDots CeNSE_IISc IIT-chennai Au111 Cell CastIron Roughness BariumTitanate PetruPoni_Institute multi_layer temp Thermoplastic_polyurethane FM-KPFM Jason BiasMode Boron semifluorinated_alkane Transparent DNAProtein AmplitudeModulation nanomechanical Nickel Friction MembraneFilter IVSpectroscopy graphene_hybrid MagneticArray PhaseTransition thermal_conductivity Lanthanum_aluminate
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Graphene
Scanning Conditions
- System: XE7
- Scan Mode: Conductive AFM
- Cantilever: NSC36C Cr-Au (k=0.6N/m, f=65kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256