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KAIST OpticalWaveguide AlkaneFilm Polyvinylidene MeltingPoint Floppy PhaseChange hetero_structure Melt Heating Pinpoint PFM CarbonNanotube Chromium ULCA Tungsten Tapping Domain SingleCrystal TemperatureControllerStage Hexylthiophene plastics Reduction Zagreb tip_bias_mode Cross-section Terrace Yttria_stabilized_Zirconia Blend CBD Sadowski Trench LateralForceMicroscopy AM_SKPM Conductivity AM-KPFM
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SnS2 Flakes
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AC240TS (k=2N/m, f=70kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.4Hz
- Pixel Size: 256 × 256