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Techcomp Modulus DOE PUR BiasMode MagneticForceMicroscopy Chromium NUS Ceramics Wildtype Metal-organicComplex mechanical_property Microchannel Electical&Electronics HOPG Molybdenum HardDiskMedia ShenYang CHRYSALIS_INC LifeScience Tin disulfide CeNSE_IISc NtuEee Tapping conductive Fiber LiftMode FloppyDisk 3-hexylthiophene NTU GranadaUniv Oxide ForceMapping Magnetic Force Microscopy Conducting
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Patterned Sapphire Substrate (PSS)
Scanning Conditions
- System: NX10
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR
- Scan Size: 40μm×40μm, 3μm×3μm
- Scan Rate: 0.3Hz, 1Hz
- Pixel: 256 × 256
- Scan Mode: Non-contact
- Cantilever: AR5T-NCHR
- Scan Size: 40μm×40μm, 3μm×3μm
- Scan Rate: 0.3Hz, 1Hz
- Pixel: 256 × 256